发明名称 Exposure apparatus and method
摘要 A production method of a semiconductor device, includes the steps of emitting an excimer laser from a light source, illuminating a pattern on a mask with the excimer laser emitted from the light source and passed through a filter, exposing a resist on a substrate of the semiconductor with the excimer laser passed through the mask, and forming a pattern on the substrate in accordance with a portion of the resist exposed with the excimer laser.
申请公布号 US6485891(B1) 申请公布日期 2002.11.26
申请号 US20000542072 申请日期 2000.04.03
申请人 HITACHI, LTD. 发明人 NOGUCHI MINORI;KENBO YUKIO;OSHIDA YOSHITADA;SHIBA MASATAKA;YOSHITAKA YASUHIRO;MURAYAMA MAKOTO
分类号 G03F1/08;G03F1/84;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03F7/20 主分类号 G03F1/08
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