发明名称 FAULT DETECTING SYSTEM AND FAULT DETECTING DEVICE
摘要 PURPOSE:To shorten the inspection time, and also, to decrease the hardware by compressing an inspection output pattern of (n) bit width to (m) bits by an exclusive OR network, and thereafter, inputting it to a multi-input feed-back type shift register (MISR). CONSTITUTION:A fault of a logic circuit for compressing an inspection output pattern as a signature is detected by an MISR 3 of (m) bits. That is, an inspection output pattern of (n) (n>m) bit width from a circuit to be inspected 1 such as an LSI, etc. is compressed to (m) bit width by a bit width compressing circuit 2 constituted of an exclusive OR network, and thereafter, inputted to the MISR 3 of (m) bit width. In such a way, a fault can be decided at a high speed without dropping the fault detection rate.
申请公布号 JPS63286780(A) 申请公布日期 1988.11.24
申请号 JP19870121291 申请日期 1987.05.20
申请人 HITACHI LTD;HITACHI MICRO COMPUT ENG LTD 发明人 IWASAKI KAZUHIKO;ARAKAWA FUMIO;MISHINA DAISUKE
分类号 G01R31/317;G01R31/28 主分类号 G01R31/317
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