发明名称 |
X-Ray diffractometer with high time resolution |
摘要 |
An x-ray diffractometer is disclosed having a position-sensitive detector which is quasi-continuously movable in stepped fashion around a sample by a stepping motor. Output signals triggered by x-ray quanta are output from the position-sensitive detector and converted by an electronic evaluation unit into a time duration corresponding to a position of a particular x-ray quantum in the detector. The time-digital converter connected to the evaluation unit converts the time duration to a digital signal. A digital adder is provided having three inputs. The first input connects to an output of the time-digital converter, the second input connects to receive a digital value generated by a counter associated with the stepping motor, and a third input connects with a digital region selector. An output of the adder connects to a multi-channel analyzer having a plurality of regions therein for analyzing various desired measurement applications. The digital region selector addresses the appropriate region in the analyzer for a desired measurement application.
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申请公布号 |
US4301364(A) |
申请公布日期 |
1981.11.17 |
申请号 |
US19800123347 |
申请日期 |
1980.02.21 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
GOEBEL, HERBERT |
分类号 |
G01N23/20;G01N23/207;(IPC1-7):G01B15/06 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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