| 摘要 |
<p>There are included input wirings (3,4) for inputting differential signals outputted from an object (2) to be tested; a higher threshold side divided-voltage generating part (5) for receiving the differential signals from the input wirings (3,4) and generating and outputting first and second divided voltages based on both a predetermined higher threshold potential (V<SUB>OH</SUB>) and the potentials of the received differential signals; and a higher threshold side potential comparator (6) for deriving a magnitude relationship between the first and second divided voltages outputted from the higher threshold side divided-voltage generating part (5). The higher threshold side divided-voltage generating part (5) includes a first divided-voltage generating part (16) and a second divided-voltage generating part (17), which generate the first and second divided voltages, respectively, such that the magnitude relationship between the first and second divided voltages in the higher threshold side potential comparator (6) corresponds to a magnitude relationship between a higher threshold potential and a potential difference between plus and minus signals.</p> |
