| 摘要 |
<p>A method in which a monocrystalline body is subjected in a gas atmosphere to a treatment changing the thickness of the body, in which the thickness of the body is controlled by means of a measuring member which is subjected to the same treatment and which measuring member, on its side which is subjected to the treatment, consists of a monocrystalline layer and an adjoining substratum of a material having a refractive index differing of that the monocrystalline layer material, characterized in that a measuring member is used in the manufacture of which the substratum is provided on a free surface of the monocrystalline layer.</p> |
