摘要 |
An apparatus and a method for measuring thickness using ultrasonic longitudinal wave and shear wave are provided to measure the thickness of an object by compensating for an error caused by the change of propagation speed according to temperature change of the object. An apparatus for measuring thickness using ultrasonic longitudinal wave and shear wave comprises a probe(11), a pulser/receiver(12), and a signal process and output device(13). The probe projects ultrasonic longitudinal wave and shear wave into an object(1) and receives each echo signal of the ultrasonic longitudinal and shear waves reflected from the object, as contacting to the object. The pulser/receiver applies electrical pulse signal to the probe to cause the probe to generate ultrasonic longitudinal and shear waves and receives each echo signal for the ultrasonic longitudinal and shear waves via the probe. The signal process and output device receives each echo signal of the ultrasonic longitudinal and shear waves received by the pulser/receiver to monitor the echo signals, measures the propagation speed of the ultrasonic longitudinal and shear waves based on the echo signals to calculate the thickness of the object, and records and displays the calculated results.
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