发明名称 QUALITY TEST ITEM DISPLAYER
摘要 PURPOSE:To reduce the number of lamps and lighting circuits by using other lamps in common for the lamps for displaying inspection items and displaying the inspection items by the on-off of the common-use lamps. CONSTITUTION:When a switch 10 for setting auto mode is set on, a measuring device 31 scans the inspected parts of a product sequentially corresponding to inspected items synchronizing with scanning signals S4, transmits the informaton to a judging device 32 and lights the second light emitting diodes 41-4n corresponding to poor quality items. For good quality items, the first light emitting diodes 31-3n are lit. If the up-switch 21 or down-switch 22 of a scanner 13 is operated with a switch 9 for setting manual mode on in this state, the second SCRs 51-5n are lit in sequence and the second light emitting diodes 41-4n are turned on and off by the on-off of a transistor 6 and display inspected items.
申请公布号 JPS56142412(A) 申请公布日期 1981.11.06
申请号 JP19800046112 申请日期 1980.04.08
申请人 GEN CO LTD 发明人 FUKUSHIMA KEISUKE
分类号 G01D21/00;(IPC1-7):01D21/00 主分类号 G01D21/00
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