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发明名称
Method and arrangement relating to inspection
摘要
申请公布号
EP1770006(B1)
申请公布日期
2008.09.10
申请号
EP20070100501
申请日期
2001.05.25
申请人
TAPIREN SURVEY SYSTEM AB
发明人
HARRIE, PER;FAGERHOLM, JOHAN;KURDVE, MICHAEL;LINDSJOE, JOHAN
分类号
B63B9/00;G01N21/88;B63B59/00;B63C11/00;B63C11/02;B63C11/26;B63C11/42;B63C11/48;G01S5/22;G01S15/74
主分类号
B63B9/00
代理机构
代理人
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地址
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