发明名称 Dry etching apparatus
摘要 A dry etching apparatus using microwaves according to the present invention is equipped with means for impressing such an AC voltage upon a sample as has a frequency ranging from 100 KHx to 10 MHx. Consequently, the sample has its surface prevented from being charged up no matter which it might be made of an insulator or might have its surface covered with an insulator. As a result, the etching rate can be maintained at a high level even for such sample.
申请公布号 US4298419(A) 申请公布日期 1981.11.03
申请号 US19800163294 申请日期 1980.06.26
申请人 HITACHI, LTD. 发明人 SUZUKI, KEIZO;OKUDAIRA, SADAYUKI;NISHIMATSU, SHIGERU;KANOMATA, ICHIRO
分类号 C23F4/00;C03C15/00;H01J37/32;H01L21/302;H01L21/3065;(IPC1-7):C23F1/02;H01L21/30;C03C25/06 主分类号 C23F4/00
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