| 摘要 |
<p>A device (10) which detects irregularities in the contour of sidewalls of a tire (T) includes transducer probes (29, 30) which are positioned by control systems (31, 40, 45) adjacent the sidewalls of the tire (T) to be tested. As the tire (T) is rotated the output signals of the transducer probes (29, 30), which are proportional to sidewall contour, are fed to a signal processing circuit (60) which provides an output signal indicative of an irregularity in the contour of a sidewall when an irregularity of a predetermined extent exists for a predetermined time period.</p> |
