| 摘要 |
<p>PURPOSE:To enable efficient test, by generating temperature failure with program by intension, stopping the operation of power supply disconnection to the device and confirming the state, in testing the abnormal temperature monitor set for each device by test program. CONSTITUTION:Various devices 1-3 constituting the information processing system are provided with the temperature abnormity detecting mechanism. In test mode, the test mode signal is on with the control of the test device 20, the AND gates 71-73 are compulsively off, so that the devices 1-3 are not interrupted for the power supply even if the temperature abnormity signals 12-14 are input. On the other hand, signals 12-14 are possible for input to FFs74-76, and FFs74-76 are on according to the signals 12-14 generated by the test of the temperature abnormity detection set. After confirming the status of FFs74-76 with the test program of the device 20, the display reset signal is on and FFs74-76 are made to the initial state, and the test is advanced to the next test item.</p> |
