APPARATUS AND METHOD FOR MEASURING PRETILT OF LC

摘要

Disclosed are an apparatus and a method to measure a pretilt of liquid crystal. The method to measure the pretilt of liquid crystal comprises a liquid crystal layer between a first substrate and a second substrate facing the first substrate. At least one of the first substrate and the second substrate irradiates polarized light to a liquid cell including a fine branch electrode; scans irradiated light with a preset angle range in a direction not parallel to the fine branch electrode; and detects an intensity of light penetrating the liquid cell. The pretilt angle of liquid crystal is obtained using an intensity detection signal of the transmitted light; thereby the pretilt angle of liquid crystal with regards to two substrates being able to be measured.