发明名称 SEMICONDUCTOR ELEMENT CAPABLE OF WITHSTANDING HIGH VOLTAGE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>SEMICONDUCTOR ELEMENT CAPABLE OF WITHSTANDING HIGH VOLTAGE AND METHOD OF MANUFACTURING THE SAME A semiconductor element such as a thyristor or a transistor which is capable of withstanding a high voltage comprises a semiconductor substrate of a pnpn-four layer structure (for a thyristor) or of a npn-three layer structure (for a transistor). An intermediate p-type layer is composed of a low concentration layer region located adjacent to an n-type layer and a high concentration layer region located adjacent to the other n-type layer. The high concentration layer region is formed through diffusion of aluminium so that the maximum concentration thereof becomes at least equal to 5 x 1016 atoms/cm3. A method of manufacturing such semiconductor element is also disclosed.</p>
申请公布号 CA1111571(A) 申请公布日期 1981.10.27
申请号 CA19780295233 申请日期 1978.01.18
申请人 HITACHI, LTD. 发明人 MOMMA, NAOHIRO;TANIGUCHI, HIROYUKI
分类号 H01L29/73;H01L21/223;H01L21/331;H01L29/08;H01L29/10;H01L29/36;H01L29/74;H01L29/861;(IPC1-7):01L29/00 主分类号 H01L29/73
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