发明名称 |
DEVICE, SYSTEM AND METHOD MEASURING PIEZOELECTRIC PROPERTIES OF THE PIEZOELECTRICITY NANOMATERIALS |
摘要 |
Disclosed are a device, a system, and a method for measuring piezoelectric properties of a piezoelectric nanomaterial. The device for measuring the piezoelectric properties of the piezoelectric nanomaterial comprises: a nanopowder press unit; an indenter position controlling unit; a press weight controlling unit; and an electronic signal measuring unit. The nanopowder press unit includes: a transparent electron microscope specimen holder which includes a conductive indenter; and a powder supporter in which piezoelectric nanopowder is distributed which is faced to the conductive indenter. The indenter position controlling unit applies voltage to a piezoelectric nanotube included the specimen holder and controls the position of an indenter. The press weight controlling unit is included in the specimen holder; and controls piezoelectric weight which is applied to the piezoelectric nanopowder by using a weight converting device connected to the indenter and the piezoelectric nanotube. The electronic signal measuring unit measures an electronic signal generated in the piezoelectric nanopowder in real time by using a measuring device which is electrically connected to the powder supporter and the conductive indenter. |
申请公布号 |
KR20160083517(A) |
申请公布日期 |
2016.07.12 |
申请号 |
KR20140195393 |
申请日期 |
2014.12.31 |
申请人 |
KOREA INSTITUTE OF MACHINERY & MATERIALS |
发明人 |
CHOI, SI YOUNG;KIM, SUNG DAE;RHYIM, YOUNG MOK;KIM, GI YEOP |
分类号 |
G01R19/22 |
主分类号 |
G01R19/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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