发明名称 Electrochemical eroding process for semiconductors.
摘要 <p>Semiconductor devices (3) are fabricated that have precise uniform thickness regions formed by a self-limiting process in which light (5) generated hole-electron pairs are used as a source of current in electrochemical erosion. A self-aligned MESFET semiconductor structure (Figs. 1 and 4) has the gate (15) positioned in etched undercuts (13, 14) of the source and drain regions (9-12). Arrays of enhancement and depletion mode FET devices can be made on the same substrate.</p>
申请公布号 EP0037876(A2) 申请公布日期 1981.10.21
申请号 EP19810100814 申请日期 1981.02.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHAPPELL, TERRY IVAN;PETTIT, GEORGE DAVID;WOODALL, JERRY MCPHERSON
分类号 H01L29/80;C25F3/12;H01L21/306;H01L21/3063;H01L21/338;H01L29/812;(IPC1-7):01L21/306;01L29/80;01L21/80 主分类号 H01L29/80
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