发明名称 1/N INSPECTION SYSTEM
摘要 PURPOSE:To inspect whether DL relay has been selected properly by driving a DL selecting circuit in a short time before DL drive and by discriminating whether it has operated normally. CONSTITUTION:Before operating or resetting DL as a load, drivers RELRT and RELDL are operated in a short time and during this time, the 1/N operation of a DL driving and selecting circuit for a DL driving line is inspected. Namely, one of lead-in inspection lines l0-ln to an inspecting circuit is held at the potential of ground G through the operation of drivers RELRT and RELDL and one of bilateral thyristors TR0-TRn which is selected with a DL drive selective signal, thereby operating the 1/N inspecting circuit.
申请公布号 JPS56134896(A) 申请公布日期 1981.10.21
申请号 JP19800036944 申请日期 1980.03.25
申请人 FUJITSU LTD 发明人 UCHIDA YUKIO;NAKAYAMA KIYOAKI
分类号 H04M3/24;G01R31/00;H04Q1/20 主分类号 H04M3/24
代理机构 代理人
主权项
地址