发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the fluctuation of substrate potential and accurately judge whether a semiconductor chip is good or bad by forming an insulating layer in about the same size as that of a pad for drawing an electrode in the separating region of the semiconductor chip. CONSTITUTION:A separating region 7 of a semiconductor chip 6 divided by field oxide films 2, 3 is provided with an N type semiconductor layer 8, on which an insulating layer 10 in about the same size as that of a pad for drawing out an electrode on the chip 6 and furthermore a metal layer 5 made of aluminum. In addition, an element region 11 divided by field oxide films 3, 4 is supplied with an MOS element consisting of a gate oxide film 12, a gate electrode 13, a source 14 and a drain 15, which is followed by forming an insulating film 16 and electrodes 17, 18 and laminating a protective film 21. Use of this semiconductor device 20 makes it possible to judge whether the semiconductor chip 6 is good or bad by making the tip of a sensor contact the metal layer 5 on the insulating layer 10, while the fluctuation of substrate potential caused by the noise of the sensor can be prevented.
申请公布号 JPS56133845(A) 申请公布日期 1981.10.20
申请号 JP19800035836 申请日期 1980.03.21
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 MINAMI KENJI;ISHIBASHI MASAYUKI
分类号 H01L21/31;H01L21/76;H01L29/78 主分类号 H01L21/31
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