发明名称 MOS FIELD EFFECT SEMICONDUCTOR DEVICE WITH HIGH BREAKDOWN VOLTAGE
摘要 PURPOSE:To improve the reliability of an MOSFET with high breakdown voltage by a method wherein the substrate surface of an MOSFET with high breakdown voltage is covered with a low-resistance layer having a fixed potential through an insulating layer so that said MOSFET is independently of the external charge. CONSTITUTION:In a semiconductor substrate 1 in which impurity has been diffused, a conductor or low-resistance layer 13 is formed so as to cover the region of a pinch resistance layer 5 through an insulating film 11. The conductor or low-resistance layer 13 is electrically connected to a source-side field plate 8' and a drain- side electrode 9 through high-resistance bodies 15 and 16 respectively in order to fix the potential of the conductor or low-resistance layer 13 in operation at an intermediate potential between the source and drain.
申请公布号 JPS56133871(A) 申请公布日期 1981.10.20
申请号 JP19800037703 申请日期 1980.03.22
申请人 SHARP KK 发明人 ASHITA TSUTOMU;NAKAGAWA KIYOTOSHI;FUJII KATSUMASA;TORIMARU YASUO
分类号 H01L27/04;H01L21/331;H01L21/822;H01L29/06;H01L29/40;H01L29/73;H01L29/78 主分类号 H01L27/04
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