发明名称 PATTERN MEASURING DEVICE
摘要 PURPOSE:To enable measuring of a period of an object to be tested through the measurement of a distance between point spectra on a Fourier transformation surface, by a method wherein the object to be tested is formed through a regularly- arranged pattern. CONSTITUTION:A coherent light, emitted from a He-Ne laser source 1, is enlarged into a proper size by means of a colimator lens system 2, and the object 4 to be tested on a XY stage 3 is illuminated by said light. Thiis enbales the transmitted light to obtain a Fourier transformation pattern on a surface, which is away from by a focus distance f, through the aid of a lens 5. The image of the Fourier transformation pattern, which is represented in a gathering of luminescent spots. is picked up by means of a detector array 16, (for example, CCD image pick-up element), and a distance between the luminescent stops can be found from said electric signal.
申请公布号 JPS56132508(A) 申请公布日期 1981.10.16
申请号 JP19800035770 申请日期 1980.03.22
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 SEKIZAWA HIDEKAZU;IWAMOTO AKITO
分类号 G01B11/14;G01B11/02;G01B11/24;G01B11/245 主分类号 G01B11/14
代理机构 代理人
主权项
地址