发明名称 Semiconductor etching preparation method - uses second UV exposure and thermal hardening to reduce blurring
摘要 <p>When semiconductors are made by etching a substrate (1) through a film mask (2,6) the unwanted areas (5) of the mask are first removed by alkaline development after ultra-violet exposure (4). One problem with this method is that the etching agent also damages the edges of the mask resulting in poor definition or blurring. A second exposure to ultra-violet rays, with a wavelength of 330 to 450 nm, gives the remaining mask fine times the resistance to etching of a mask which has not received this second exposure. The substrate and mask are then put into a 125 deg.C. infra-red oven, for 5 minutes to provide further hardening of the film.</p>
申请公布号 NL8001561(A) 申请公布日期 1981.10.16
申请号 NL19800001561 申请日期 1980.03.17
申请人 N.V. PHILIPS' GLOEILAMPENFABRIEKEN TE EINDHOVEN. 发明人
分类号 G03F7/20;(IPC1-7):03B15/00;01L21/30 主分类号 G03F7/20
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