发明名称 |
PROCESS AND DEVICE FOR THE EVALUATION OF PHOTOMETRIC MEASUREMENT VALUES |
摘要 |
<p>A method for the rapid and direct evaluation of photometric measurement values comprises (a) successively and cyclically passing all measurement positions into the field of view of a photometric detector in such a manner that after the last measurement position is examined, the first measurement position is again examined, wherein this scanning of the measurement positions is continuously repeated with high speed during the whole evaluation period; and (b) feeding the voltage thereby produced in the photometric measurement cell as the deflection input of an oscillograph whose sweep frequency is coordinated with the frequency at which the measurement positions pass by the detector. A corresponding device which readily enables performance of this method is also provided.</p> |
申请公布号 |
CA1110465(A) |
申请公布日期 |
1981.10.13 |
申请号 |
CA19780311672 |
申请日期 |
1978.09.20 |
申请人 |
MERCK PATENT GESELLSCHAFT MIT BESCHRANKTER HAFTUNG |
发明人 |
KLAUS, ROBERT;HALPAAP, HERBERT;HAUCK, HEINZ-EMIL |
分类号 |
G01J3/00;G01N21/17;G01N21/59;G01N27/447;G01N30/84;G01N30/95;(IPC1-7):01N21/22 |
主分类号 |
G01J3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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