发明名称 |
Test pattern generating apparatus |
摘要 |
A test pattern generating apparatus in which a microprogram describing a test pattern to be generated is read for interpretation and execution, address and data patterns are generated by arithmetic operations and a memory control signal is produced, the address and data patterns and the memory control signal being applied to a memory under test. The address pattern is provided to an area inversion control signal generation section to produce an inversion control signal corresponding to the address pattern, by which the data pattern may be inverted and then outputted.
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申请公布号 |
US4293950(A) |
申请公布日期 |
1981.10.06 |
申请号 |
US19790026246 |
申请日期 |
1979.04.02 |
申请人 |
NIPPON TELEGRAPH AND TELEPHONE PUBLIC CORPORATION |
发明人 |
SHIMIZU, MASAO;TOKUNO, TAKASHI;ISHIKAWA, KOHJI;NARUMI, NAOAKI;OHGUCHI, OSAMU |
分类号 |
G01R31/3181;G01R31/319;G11C29/10;G11C29/56;(IPC1-7):G06F11/00;G01R31/28 |
主分类号 |
G01R31/3181 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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