发明名称 |
AUTOMATIC TEST DEVICE OF VEHICLE |
摘要 |
<p>PURPOSE:To enhance the reliability on the precision of test of a vehicle by a method wherein a gate circuit of the tester is closed to prevent incoming of an information from the central processing unit during the unnecessary period of information to be transmitted from the central processing unit. CONSTITUTION:In the terminal tester 20, a digital processing unit 4 with a built-in microcomputer closes the gate circuit 21 to insulate an interrupt command from the central processing unit when a test of carrying apparatus being in charge of the terminal tester is to be performed. Accordingly respective tests by the terminal tester can be performed without any interruption from the outside.</p> |
申请公布号 |
JPS56123701(A) |
申请公布日期 |
1981.09.29 |
申请号 |
JP19800026611 |
申请日期 |
1980.03.05 |
申请人 |
HITACHI LTD |
发明人 |
YAMAGUCHI FUMIO;KOIKE HIROSHI |
分类号 |
G01R31/00;B60L3/00;G01M17/007;G01M17/08 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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