发明名称 Method of making an extremely low current load device for integrated circuit
摘要 A MOSFET random access memory having an extremely low current load memory cell is disclosed. The memory cell comprises a cross-coupled binary stage in which one or more paths to ground can be selectively switched on or off through true and complement data nodes. Impedance means connect a power supply node to the data nodes for charging the data nodes to predetermined voltage levels. The impedance means comprise an intrinsic-extrinsic junction of a substantially pure, intrinsic semiconductor material and a diffusion of extrinsic conductivity impurities disposed within a region of the intrinsic semiconductor material. The impedance means is formed by an isoplanar silicon gate process as an integral portion of a polycrystalline silicon strip which interconnects the power supply node to a data node. A portion of the polycrystalline silicon strip is extended from the data node to form the gate of the transistor to which it is cross-coupled.
申请公布号 US4290185(A) 申请公布日期 1981.09.22
申请号 US19790043420 申请日期 1979.05.29
申请人 MOSTEK CORPORATION 发明人 MCKENNY, VERNON G.;CHAN, TSIU C.
分类号 G11C11/412;H01L21/02;H01L21/3205;H01L21/3215;H01L23/522;H01L27/11;(IPC1-7):H01L21/00 主分类号 G11C11/412
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