发明名称 HEAT TREATMENT OF SEMICONDUCTOR WAFER
摘要 PURPOSE:To prevent the ununiformity of heat treatment preventing oxidation of the semiconductor wafer by a method wherein the semiconductor wafer is arranged in a reaction cylinder preventing air back-flowing from an opening part at the opposite side from a gas introducing tube of heat treatment tube and is heat-treated. CONSTITUTION:The semiconductor wafer 5 (6 is a quartz boat) is put in the reac- tion cylinder 7 having ventilating holes to prevent air back-flowing from the opening part 4 at the opposite side from the gas introducing tube 3 of the heat treatment tube 2 consisting of quartz arranged in a heating furnace 1, and the semiconductor wafer is heat-treated (8 is a draw out bar, 9 is an operating device). Accordingly oxidation of the semiconductor wafer by back-flowing air is prevented, and the ununiformity of sintering treatment by the influence of gas current is prevented.
申请公布号 JPS56115524(A) 申请公布日期 1981.09.10
申请号 JP19800018135 申请日期 1980.02.16
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAGAI HIROTAKE
分类号 H01L21/22;C23C16/44;C30B31/10 主分类号 H01L21/22
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