发明名称 |
FORMING METHOD OF INSULATION REGION IN SEMICONDUCTOR SUBSTRATE |
摘要 |
PURPOSE:To form an insulation region at a deep position inside a semiconductor substrate by making porous a P type region formed through irradiation of a light element charged particle and the resorting to oxidation means. CONSTITUTION:A P type semiconductor region 4 having a thickness W at a position D from the main surface 2 of a semiconductor substrate 1 in the said semiconductor substrate by irradiating a light element charged electron beam 3 consisting of proton, deutron or helium ion on the N type semiconductor base 1 from its two sides. Next, anodic formation on the semiconductor region 4 is performed, so that the said region is porous. After this process, the semiconductor substrate 1 is arranged in a heated oxygen atmosphere to make the porous region an insulated isolation region 6. Then a semiconductor circuit is formed on the insulated isolation region 7. Thus a semiconductor device where an insulated region is formed way deep inside the substrate, can be obtained. |
申请公布号 |
JPS56110247(A) |
申请公布日期 |
1981.09.01 |
申请号 |
JP19800012173 |
申请日期 |
1980.02.04 |
申请人 |
NIPPON TELEGRAPH & TELEPHONE |
发明人 |
MIZUSHIMA YOSHIHIKO;TAKEDA AKITSU;YAMAGUCHI MASASHI;KUDOU KIYOSHI |
分类号 |
H01L27/00;H01L21/265;H01L21/316;H01L21/331;H01L21/76;H01L21/762;H01L29/73 |
主分类号 |
H01L27/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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