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发明名称
Integrated circuit testing
摘要
申请公布号
GB2069152(A)
申请公布日期
1981.08.19
申请号
GB19810002411
申请日期
1981.01.27
申请人
POST OFFICE
发明人
分类号
B67C3/26;G01R31/308;(IPC1-7):G01R31/28
主分类号
B67C3/26
代理机构
代理人
主权项
地址
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