| 摘要 |
<p>PURPOSE:To effectively screen a ROM by setting an external signal to apply a normal voltage to a ROM bit line at the time of screening voltage application a semiconductor device. CONSTITUTION:Bit lines B1-Bn of the ROM are connected to a VDD line and charged when a clock phi1 is active through load transistors G1-Gn. When defective ROMs are screened, the gate input to the load transistors G1-Gn is connected to the VDD line by disconnecting the clock phi1 by a selection circuit 2. Thus, a defect of the ROM is deteriorated at the time of screening to eliminate the defect by checking the circuit after screening.</p> |
