发明名称 AUTOMATIC MEASUREMENT INSTRUMENT WITH MEASUREMENT SURFACE LEVELLOFF DEVICE
摘要 PURPOSE:To obtain a real value of measurement by providing a depressor at the tip of a measurement instrument, levelling off a high crest which is not tolerated in terms of micron on a measurement surface and measuring this filled-up levelled-off surface. CONSTITUTION:An electric micrometer 1 has a probe provided at one end of a lever 30 supported by a body on the middle and a movable rod 31 of a differential transformer 23 on the other end. At the forward position in the direction of movement of the probe of the micrometer 1, a measurement level-off device N provided with a depressor 9 which depresses a measurement surface is provided. When a boring hole is measured, the measurement level-off device N provided at the tip of the micrometer 1 sequentially passes through borings. At that time, crests existing outside of a tolerance on a measurement surface are levelled off under the effect of a depressing force by the depressor 9.
申请公布号 JPS56101509(A) 申请公布日期 1981.08.14
申请号 JP19800004410 申请日期 1980.01.18
申请人 HITACHI SEIKI KK;NISSAN MOTOR 发明人 SEKI KENZOU;IMAIZUMI HIROMI;EGUCHI TOSHIKATSU
分类号 G01B5/00;G01B7/00;G01B7/02;G01B7/34;G01B21/02 主分类号 G01B5/00
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