| 摘要 |
PURPOSE:To make a dark room processing needless as well as to record and detect a material image generated from a diffraction image or a diffraction ray by a method wherein a heat fluorescent material capable of recording a radiation with high sensitivity is utilzed as an image receiving body. CONSTITUTION:When a radiation 2 such as X-rays and electron rays radiated from a radiation generation device 1 is irradiated onto a material sample 3, a diffraction ray 4 corresponding to an inverse lattice of the material sample 3 is generated. This diffraction ray 4 is photographed by means of an image receiving body 5 wherein a heat fluorescent material layer 5b composed of heat fluorescent material is formed on a substrate 5a. The heat fluorescent material layer 5b generates an electron-positive hole couple with the diffraction ray 4 and the electron is trapped at a capture level. With this, a diffraction image is recorded in the heat fluorescent material layer 5b. When being heated upto the light emitting temperature of a heat fluorescent material, this excitation electron first transists into the ground state and before heating is applied, the diffraction image is stably recorded. |
