| 摘要 |
PURPOSE:To accurately stop the semiconductor element at a measuring position by providing a substopper rotatably formed of elastic material for receiving the package of the semiconductor element dropped from an oblique chute and a stopper formed of elastic material provided directly under the substopper. CONSTITUTION:The package 7 of the semiconductor element 1 dropped by its own weight on the oblique chute 3 is received by the substopper 11 formed of elastic material, a piston 15 is operated to rotate the substopper 11 counterclockwise through a lever 12 so as to further drop the element 1, the element is stopped by the stopper 17 formed of elastic material provided directly under the element 1, and is measured by a characteristic measuring element provided under the stopper 17. Thus, the jumping of the element can be eliminated, the element is not damaged, and the measurement becomes rapid, and the element can be accurately stopped at the measuring position. |
