X-ray diffraction chamber for the study of a single crystal located in a polycrystalline sample,申请号US19620215663-传众专利搜索

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发明名称	X-ray diffraction chamber for the study of a single crystal located in a polycrystalline sample
摘要
申请公布号	US3149228(A)	申请公布日期	1964.09.15
申请号	US19620215663	申请日期	1962.08.08
申请人	COMMISSARIAT A L'ENERGIE ATOMIQUE	发明人	ANSELIN FRANCOIS;CHENAIS JEAN
分类号	G01N23/20	主分类号	G01N23/20
代理机构		代理人
主权项
地址

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