| 摘要 |
PURPOSE:To enable the test operation without giving adverse effect on the processing of the center device, by providing means cutting off the measured terminal connected with the center device, for the logical connecting state with the center device at failure. CONSTITUTION:At terminal, the measured data from the sensor side is read in with a read-in circuit RD, is given to the inspection circuit CK and the editing circuit ED, and if the result of inspection of the inspection circuit CK is good, the data is stored to the memory MEM, the transmission/reception control section TR informs the presence of data to the center, and when the read-in instruction is from the center, the data transmission is made. When the center detects the failure of data and informs to the operator, the operator operates the switch SW to set the flag FG. Thus, the gates A2, A4 are open, A1, A3 are closed, and the center device is logically cut off from the terminal device. The data from the sensor is stored in the memory MEM and it is printed out on the printer with the control of the printer control section PRC to judge the failure. |
