| 摘要 |
A variable voltage, the magnitude of which corresponds to the controlled gain of a circuit through which stitch parameter controlling signals are passed is generated at the wiper arm of a potentiometer connected across a voltage source. The voltage thus obtained from the potentiometer is applied to a decoding circuit that has a plurality of output terminals to supply current to individual semiconductor devices that change their visible condition in response to such current. The decoder causes specific ones of the semiconductor devices to respond in that way so as to produce a pattern directly related to the gain of the circuit through which the stitch information passes. The decoder may be arranged to generate a bar graph representation of the gain or the change may be limited to the semiconductor device that represents the most extreme such device that would be affected by the voltage from the potentiometer for a given setting. Two devices that visibly display stitch parameters, such as the bight and feed, can be mounted on a sewing machine to provide visible information corresponding to modification of pattern size by a control that controls both the gain and the potentiometer from which the related voltage is obtained.
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