| 摘要 |
PURPOSE:To reduce the test man-power and to enable automation, by switching the clock signal into high speed clock signal after the establishment of test line with a low speed clock signal, in the system prosent in the microcomputer built-in units of a plurality. CONSTITUTION:Control units 16-1-16-n of processing units 11-1-11-n are driven with the clock CLK from a test unit 13, and the next start signal ST establishes the test line among the data processing unit 11 and control units 16 and 17 of the test unit 13, and the control signal CONT is returned to the test unit 13. The test unit 13 receives this signal and releases the start signal ST, switches the signal into high speed clock signal, drives the computer 14 and executes the protocol for direct test with the computer 15 of the test unit 13. |
