| 摘要 |
The output of a data storage array is gated into an error correcting code based syndrome generator (18) and a register (16), the syndrome being gated into an associative store (20) holding all connectable syndromes and a "no-error" syndrome with search field and bit locators in its result field. Hit and miss signals pass to gating control (22) which respond to a miss (NC) to gate, sequentially, test patterns from a store (30) into the above and back to the syndrome generator. If, at the end of the tests a specific number of errors are identified which number lies in the correcting capability of the code, an identifier syndrome is copied from the search field of the store (20) into register (32) and the syndromes in (28) and (32) are XORed at (34) and used to interrogate the store (20). The error locations from (20) for the test syndrome and the output of (34), (if any) are used by inverter controls (26) to correct the data in (16). |
