发明名称 Method and apparatus for inspection of ceramic parts for defects
摘要 A method and apparatus for inspection of ceramic parts for defects utilizes the application of an electrical test voltage to the part to be inspected, and at the same time subjecting the part to acoustic emission analysis. Use of the acoustic emission analysis allows discovery of not only defects which may arise because of the application of the electric current, but also defects or structural damage which are already existant in the part to be tested. An apparatus for carrying out the method on a high-volume basis allows rapid insertion and removal of a part between electrodes and clamps the part in place during testing.
申请公布号 US4277977(A) 申请公布日期 1981.07.14
申请号 US19790047476 申请日期 1979.06.11
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 LUBITZ, KARL;DREW, JEFFREY M.;SCHUHMANN, WERNER P.
分类号 G01R31/00;G01N29/12;G01N29/14;G01R31/12;(IPC1-7):G01N29/00 主分类号 G01R31/00
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