发明名称 Sample mount for X-ray diffraction
摘要 A sample mount assembly for use with an X-ray diffractometer. The assembly includes a holder with an opening extending therethrough, an insert to fit into the holder through its opening, a substrate filter layer, and the exposed sample layer mounted on the filter. The holder's opening is larger at its lower surface than at its upper surface such, that the insert which is shaped as a four side truncated pyramid, can be placed into the holder from its lower surface but not through its upper surface opening. The layer filter with its mounted sample layer is sandwiched between the insert and holder to allow the sample to be exposed to incident X-rays through the holder's upper surface. Plastic tape or some other securing mechanism is used to secure the holder to the insert at the holder's lower surface. The result is a mount that allows easy installation and removal with automatic sample changers for X-ray diffraction of the membranes with no vertical offset and a flat, even, sample upper surface.
申请公布号 US4278883(A) 申请公布日期 1981.07.14
申请号 US19790108260 申请日期 1979.12.27
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE INTERIOR 发明人 HATHAWAY, JOHN C.;POPPE, LAWRENCE J.
分类号 G01N23/20;(IPC1-7):G01N23/20 主分类号 G01N23/20
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