发明名称 VOLTAGE MEASURING APPARATUS
摘要 <p>PURPOSE:To achieve a higher voltage measuring accuracy eliminating changes in a transmission impedance of a measuring cable, by scanning a laser beam at a position of an object to e measured where a voltage is distributed to a number of terminals or at more than one part to convert changes in the voltage to changes in the quantity of light of the laser beam utilizing a double refraction property of an electrochemical crystal. CONSTITUTION:A plurality of electrodes 13 for contact are arranged in contact with one, two or more feeder parts of an object 11 to be measured and an electrochemical crystal 14 which is laminated between the electrode 13 and a transparent electrode 15 for setting is provided with a double refraction property as caused by a voltage. A laser light l incident upon the crystal 14 from a laser light source 20 is generated and undergoes an optical axis conversion by an optical system such as a 1/4 deflection plate 16, a polarized beam splitter 17 and a lens system 18 to scan the light l per electrode 13 with a deflector 19. The quantity of light proportional to a voltage to be measured as object 11 is received with a light receiver 22 from the beam light subjected to the optical axis conversion and a detection signal S1 detected is processed 23 to control driving and measuring test control systems 21 and 24.</p>
申请公布号 JPS6428566(A) 申请公布日期 1989.01.31
申请号 JP19870183852 申请日期 1987.07.23
申请人 FUJITSU LTD 发明人 WAKANA SHINICHI;GOTO YOSHIAKI
分类号 G01R19/00;G01R15/24;G01R31/302 主分类号 G01R19/00
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