发明名称 Improvements in or relating to apparatus for a reative plasma process.
摘要 <p>The quality of a plasma etching process is improved by withdrawing a small current from the plasma which causes the reaction to produce a uniform, controllable self-bias on a workpiece placed on one plasma energizing electrode. A DC potential supporting the current may be applied by means of a probe (26) positioned in the plasma or to one of the plasma energizing electrodes.</p>
申请公布号 EP0031704(A2) 申请公布日期 1981.07.08
申请号 EP19800304664 申请日期 1980.12.22
申请人 WESTERN ELECTRIC COMPANY, INCORPORATED 发明人 KUYEL, BIROL
分类号 H01L21/302;H01J37/32;H01L21/3065;(IPC1-7):01J37/32 主分类号 H01L21/302
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