发明名称 LOGIC CIRCUIT TESTING SYSTEM
摘要 PURPOSE:To enable the fault points in the parts in the system to be easily specified by providing an adapter which connects an arbitrary replacement unit to a logic device and comparing the output signals when the 1st and 2nd replacement units are connected. CONSTITUTION:The specific replacement unit 2A substituted with an adapter 5 is connected to a logic device 1 via a connector 6, the internal connection of the adapter 5 and a connector 3. On the other hand, the replacement unit 2B to be tested is connected to the adapter 5 via a connector 7. Both of the specific replacement unit 2A and the replacement unit 2B to be tested are put in the operating state of the logic device 1, and the logic signals on the corresponding output terminals of the respective replacement units are compared in a comparator 9, and further if there is any difference, this is displayed in a holding and displaying circuit 10.
申请公布号 JPS5679969(A) 申请公布日期 1981.06.30
申请号 JP19790157661 申请日期 1979.12.05
申请人 NIPPON ELECTRIC CO 发明人 MARUYAMA OKU
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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