发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent an IC from mulfunction and to seek a high integration by a method wherein a source (or a drain) of an MOSFET is connected to an input terminal of an IC and a power source voltage is applied to a gate. CONSTITUTION:When a voltage Vth+DELTAVth having a value equal to more than the threshold value of a FET4 is applied to a signal input terminal 1a, a VDD-Vth- DELTAVth appears at the source (or drain) side, because a power source voltage VDD is being applied to a gate, and even when a wiring 1 crosses diffusion layers 2, 3, the layer 2 and the layer 3 do not become conductive. With this constitution, a continuity (or a punch through phenomenon) among each diffusion layer due to a parasitic MOS effect peculiar to an MOSIC can be itgerrupted. Accordingly, a layout of patterns can be performed easily and a chip is reduced in size, thus, a system of high integration and high reliability being obtained.
申请公布号 JPS5679465(A) 申请公布日期 1981.06.30
申请号 JP19790156497 申请日期 1979.11.30
申请人 MITSUBISHI ELECTRIC CORP 发明人 ISODA KATSUFUSA
分类号 H01L21/8234;H01L27/02;H01L27/088;H01L29/78 主分类号 H01L21/8234
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