发明名称 MEASURING METHOD FOR ELECTRON BEAM DIAMETER
摘要 PURPOSE:To keep the error in measuring the electron beam diameter constant by providing a movable holder above an aperture, attaching a knife edge to the movable holder, and previously adjusting the distance between the top end of the knife edge and the inner end of the aperture to a given value. CONSTITUTION:A distance l between a nonmagnetic thin wire 5 and the inner end of an aperture 3 is measured, and a voltage is applied to a piezoelectric transducer 8 to adjust the position of a holding plate 7 so that the distance l is equal to a given value. Performing measurement with the distance l kept constant permits an angle theta made by the path of a beam component 4'' reflected by the nonmagnetic thin wire 5 and the optical axis of the beam to be constant at all times, so that a constant relation is established between the real value of the electron beam diameter and the measuring result, and therefore excellent reproducibility can be obtained.
申请公布号 JPS5679275(A) 申请公布日期 1981.06.29
申请号 JP19790156665 申请日期 1979.12.03
申请人 FUJITSU LTD 发明人 OKABE MASAHIRO;ITOU AKIO
分类号 G01T1/29;G01B15/00 主分类号 G01T1/29
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