发明名称 ELECTRON BEAM DEVICE
摘要 PURPOSE:To remove the chromatic aberration due to deflection by so winding a plurality of lens coils provided along the optical axis separately that magnetic fields generated by each lens coil are opposing each other. CONSTITUTION:An electron lens 4 is constituted by providing lens coils 7, 8 in a yoke 6 along the optical axis Z. A deflecting coil 9 is provided in the electron lens 4, and a sample 5 is placed below. The lens coils 7, 8 are so wound that magnetic fields generated by each lens coil are opposing each other, and are so designed that the integration of optical axis component of the magnetic fields between the deflection center Z0 to the sample level Zs (sum of area S1 and S2) is to be zero. Thus the rotational direction component of aberration due to deflection can be made zero.
申请公布号 JPS5678051(A) 申请公布日期 1981.06.26
申请号 JP19790155104 申请日期 1979.11.30
申请人 NIPPON ELECTRON OPTICS LAB 发明人 GOTOU TOSHINORI
分类号 H01J37/147;H01J37/305;H01L21/027 主分类号 H01J37/147
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