| 摘要 |
PURPOSE:To decrease the number of pattern matchers by storing the same data in the test register and testing it, in case when a data in the working register is tested, in the system for testing the status of the data processing unit and its operation result. CONSTITUTION:A data which has been processed by the arithmetic circuit 12 is latched to the output data register 13, and is stored in one of the working registers 21-2n. When it is desired to test this data, the data is stored in the test register 25, as well, by the micro-instruction. It is designated to test the contents of the register 25 in its test field by the next micro-instruction. The test field of this micro- instruction is decoded by the test matrix 19, it is collated with the data in the test register 25, the test result is stored in the test result store register 24, and it is utilized as a selective condition of the micro-instruction selective circuit 17. |
