发明名称 MANUFACTURE OF SEMICONDUCTOR THIN FILM
摘要 PURPOSE:To obtain a superior semiconductor thin film on an insulating monocrystalline substrate by a method wherein an impurity is ion implanted to the surface of the insulating monocrystalline substrate, an amorphous film or a polycrystalline film is formed on it and a laser beam, etc., is irradiated to it. CONSTITUTION:A sapphire substrate of about 0.3mm. thickness is abraded, and the smashed layer is removed with phosphoric acid. After B ions are implanted, amorphous Si is piled up with Si evaporated by an electron beam. Irradiating a laser beam from the back face of substrate in a vacuum, a pulse type electron beam is irradiated from the front face of the Si film. The single crystal of Si obtained by this way has the extremely superior characteristic, and the superior characteristic can be obtained when the semiconductor device is formed on this layer.
申请公布号 JPS5673448(A) 申请公布日期 1981.06.18
申请号 JP19790149525 申请日期 1979.11.20
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 OOMURA KAZUMICHI
分类号 H01L21/20;H01L21/86 主分类号 H01L21/20
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