发明名称 MOS DYNAMIC RANDOM ACCESS MEMORY
摘要 PURPOSE:To prevent unequality of a cell capacitance by a method wherein a separating gate is used to separate a word line of an MOS dynamic RAM from a memory cell and an MOS capacitance is constituted with the 2nd layer polysilicon gate. CONSTITUTION:An 1-transistor 1-capacitor type memory cell consists of an N<+> diffusion area 11 constituting a bit line, the 1st layer polysilicon gate 12 constituting a word line, a separating gate 16 wherein a VSS voltage is applied to separate each memory cell one another, the 2nd layer polysilicon gate 13 constituting an MOS capacitor and a gate oxide film 14. And during the 1st layer polysilicon gate being formed, each of the gate are of a transfer transistor, the area of an MOS capacitor and the area of an N<+> diffusion layer is decided and they are equal without depending upon an error of a mask matching, thus, resulting in each equal cell capacitance and each equal bit line capacitance.
申请公布号 JPS5667959(A) 申请公布日期 1981.06.08
申请号 JP19790143476 申请日期 1979.11.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUJISHIMA KAZUYASU
分类号 H01L27/10;H01L21/8234;H01L21/8242;H01L27/088;H01L27/108;H01L29/78 主分类号 H01L27/10
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