| 摘要 |
PURPOSE:To facilitate the formation of a mask for correction by reducing the inside or outside width size of a +X-side resonance branch of crystal lengthwise and partially by a multiple of 1/1,000mm. when correcting a difference in natural oscillation frequencies between right and left resonance branches of a tuning fork type quartz oscillator. CONSTITUTION:To correct a difference in natural oscillation frequency between right and left resonance branches of the tuning fork type quartz oscillator, the size of the +X-side branch is partially reduced. Namely, when the length of the attenuation of the +X-side resonance branch width is denoted by D and the reduced width as E, the size D and its position are so determined that E will be an integral multiple of 1/1,000mm.. Thus, the photomask for determining the profile of the oscillator can be designed with the integral multiple of 1/1,000mm. and the number of digitizing processes are reduced as well as the occurrence of a miss. |
