METHOD FOR MEASUREMENT AND DISCRETIZATION OF SURFACE PROFILES,申请号PL19780212132-传众专利搜索

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发明名称	METHOD FOR MEASUREMENT AND DISCRETIZATION OF SURFACE PROFILES
摘要
申请公布号	PL116109(B2)	申请公布日期	1981.05.30
申请号	PL19780212132	申请日期	1978.12.22
申请人		发明人
分类号	G01B;G01B7/28;G01B7/34;(IPC1-7):G01B7/28	主分类号	G01B
代理机构		代理人
主权项
地址

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