发明名称 Method and device for contact-free interval or thickness measurement by control of the direction of a light ray beam
摘要 A method and apparatus is disclosed for contact-free interval or thickness measurement. A sharply concentrated light beam is periodically deflected over a measuring space having a measuring plane and reference plane situated therein. A beam divider is positioned after the beam deflector and deflects the beam towards first, second and third light detectors. A fourth light detector is also provided to receive reflected light from the measuring plane and reference plane. A first time difference is utilized to control deflection frequency of the light beam; a second time difference controls deflection amplitude of the light beam; a third time difference determines a spacing of the measuring plane from the reference plane; and a fourth time difference corrects for changes in a direction of the light beam such as when a new light source is positioned in the system or when other directional errors occur.
申请公布号 US4266875(A) 申请公布日期 1981.05.12
申请号 US19800118778 申请日期 1980.02.05
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BODLAJ, VIKTOR
分类号 G01B11/00;G01B11/02;G01B11/06;G01S17/46;(IPC1-7):G01S9/62 主分类号 G01B11/00
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